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Please use this identifier to cite or link to this item: http://hdl.handle.net/10926/1342

Title: Raman signature of graphene superlattices
Authors: Ferreira, Erlon Henrique Martins
Carozo, Victor
Almeida, Clara Muniz da Silva de
Cançado, Luiz Gustavo de Oliveira Lopes
Achete, Carlos Alberto
Vasconcelos, Ado Jorio de
Keywords: Nanometrologia : materiais de carbono
Grafeno
Espectroscopia Raman
Issue Date: 2011
Citation: CAROZO, V. et al. Raman Signature of Graphene Superlattices. Nano Letters, v. 11, p. 4527-4534, 2011.
Abstract: When two identical two-dimensional periodic structures are superposed, amismatch rotation angle between the structures generates a superlattice. This effect is commonly observed in graphite, where the rotation between graphene layers generates Moir e patterns in scanning tunneling microscopy images. Here, a study of intravalley and intervalley double-resonance Raman processes mediated by static potentials in rotationally stacked bilayer graphene is presented. The peak properties depend on the mismatch rotation angle and can be used as an optical signature for superlattices in bilayer graphene. An atomic force microscopy system is used to produce and identify specific rotationally stacked bilayer graphenes that demonstrate the validity of our model.
Description: 8 p. : il.
Document type: Artigo / Article
Unit: Divisão de Metrologia de Materiais - DIMAT
Appears in Collections:DIMAT | Artigos publicados em periódicos internacionais

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