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Please use this identifier to cite or link to this item: http://hdl.handle.net/10926/1375

Title: Quantifying defects in graphene via raman spectroscopy at different excitation energies
Authors: Cançado, Luiz Gustavo de Oliveira Lopes
Vasconcelos, Ado Jorio de
Ferreira, Erlon Henrique Martins
Stavale Júnior, Fernando Loureiro
Achete, Carlos Alberto
Capaz, Rodrigo Barbosa
Moutinho, Marcus Vinicius de Oliveira
Lombardo, A.
Kulmala, T. S.
Ferrari, C.
Keywords: Nanometrologia : materiais de carbono
Grafeno
Espectroscopia Raman
Energia de excitação
Issue Date: 2011
Citation: CANÇADO, L. G. et al. Quantifying defects in graphene via raman spectroscopy at different excitation energies. Nano Letters, v. 11, p. 3190-3196, 2011.
Abstract: We present a Raman study of Ar+-bombarded graphene samples with increasing ion doses. This allows us to have a controlled, increasing, amount of defects. We find that the ratio between theDandGpeak intensities, for a given defect density, strongly depends on the laser excitation energy. We quantify this effect and present a simple equation for the determination of the point defect density in graphene via Raman spectroscopy for any visible excitation energy. We note that, for all excitations, the D to G intensity ratio reaches a maximum for an interdefect distance∼3 nm. Thus, a given ratio could correspond to two different defect densities, above or below the maximum. The analysis of the Gpeak width and its dispersion with excitation energy solves this ambiguity.
Description: 7 p. : il.
Document type: Artigo / Article
Unit: Divisão de Metrologia de Materias - Dimat
Appears in Collections:DIMAT | Artigos publicados em periódicos internacionais

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